Phase Shifting Digital Speckle Pattern Interferometry: Off-the-shelf set-up description and application to stainless steel membrane displacement measurements.

機譯：相移數碼散斑圖案干涉測量：從貨架上的設置描述和應用于不銹鋼膜位移測量。

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Phase shifting digital speckle pattern interferometry (PDSPI) is well suited for micrometric displacement measurements. It is non-intrusive and without contact for the object under investigation. Speckle is generated when a beam of coherent light impinges the surface of an optically rough object. Designing the system with off-the-shelf components implies the full understanding of speckle generation, image acquisition and processing. This paper will describe the main components and their contribution to the final result, from the speckle effect to the unwrapping of the phase. The designed PSDSPI set-up allows the study from small to large areas and can produce quantitative displacement maps using phase shifting principle. As an application the object is a flat circular steel membrane closing a depression chamber. The size of the membrane is about 20 mm in diameter. The membrane deformation is measured using step by step PSDSPI process while decreasing pressure in the chamber. The results show a typical displacement of about 1μm for 1 mbar. Quantitative profiles of the membrane deformation can be obtained. Further applications will be presented, including measurement corrections by shape of the object. Phase discontinuities will be discussed.

機譯：相移數字散斑圖案干涉測量法（PDSPI）非常適合微米位移測量。它是非侵入性的，無需接觸對象正在調查。當一束相干射擊撞擊光學粗糙物體的表面時產生斑點。使用現成部件設計系統意味著對斑點生成，圖像采集和處理的全面了解。本文將從散斑效應到階段的展示中，將主要組成部分及其對最終結果的貢獻描述。設計的PSDSPI設置允許從小到大面積的研究，并且可以使用相移原理產生定量位移圖。作為應用，物體是封閉凹陷室的扁平圓形鋼膜。膜的尺寸直徑約為20mm。使用步驟PSDSPI工藝的步驟測量膜變形，同時降低腔室中的壓力。結果顯示為1毫巴的典型位移約1μm?？梢垣@得膜變形的定量譜。將呈現進一步的應用，包括通過對象的形狀的測量校正。將討論相位不連續性。

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來源
《Society of Photo-Optical Instrumentation Engineers Conference on Speckle Metrology》|2003年||共6頁
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作者
P. Slangen; B. Gautier; SPIE-The International Society for Optical Engineering;
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原文格式 PDF
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中圖分類 N-532;
關鍵詞
speckle; interferometry; phase shifting;

機譯：斑點;干涉測量;相移;

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專利

1. Boundary detection of internal defect based on discontinuity of second-order gradient of out-of-plane displacement in phase-shifting digital speckle pattern interferometry [J] . K.F. Wang NDT & E international . 2014,第jana期

機譯：相移數字散斑干涉圖中基于平面外位移二階梯度不連續性的內部缺陷邊界檢測
2. Boundary detection of internal defect based on discontinuity of second-order gradient of out-of-plane displacement in phase-shifting digital speckle pattern interferometry [J] . K.F. Wang NDT & E International: Independent Nondestructive Testing and Evaluation . 2014,第Null期

機譯：相移數字散斑干涉圖中基于平面外位移二階梯度不連續性的內部缺陷邊界檢測
3. Volume-grating phase-shifting digital speckle pattern interferometry used for measurement of out-of-plane displacement field [J] . Wang KF., Tieu AK. Optics & Laser Technology . 2004,第2期

機譯：用于測量面外位移場的體柵相移數字散斑干涉圖
4. Phase Shifting Digital Speckle Pattern Interferometry: Off-the-shelf set-up description and application to stainless steel membrane displacement measurements. [C] . P. Slangen, B. Gautier, SPIE-The International Society for Optical Engineering Society of Photo-Optical Instrumentation Engineers Conference on Speckle Metrology . 2003

機譯：相移數碼散斑圖案干涉測量：從貨架上的設置描述和應用于不銹鋼膜位移測量。
5. Simultaneous phase shifted digital speckle pattern interferometry. [D] . Saif, Babak Nasser. 2004

機譯：同時相移數字散斑圖案干涉儀。
6. Three-Dimensional Continuous Displacement Measurement with Temporal Speckle Pattern Interferometry [O] . Jie Qin, Zhan Gao, Xu Wang, 2016

機譯：用時間散斑干涉法進行三維連續位移測量
7. Universal optical setup for phase-shifting and spatial-carrier digital speckle pattern interferometry [O] . 2016

機譯：用于相移和空間載波數字散斑圖案干涉測量的通用光學裝置

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Phase Shifting Digital Speckle Pattern Interferometry: Off-the-shelf set-up description and application to stainless steel membrane displacement measurements.

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